Stress distribution and diamond phases in polycrystalline diamond film have
been investigated by micro-Raman spectroscopy. Intensity, lineshape and pe
ak position of the diamond Raman line largely change on the film surface, p
articularly if grain center and grain boundary regions are compared. Wherea
s in the center of the grains the characteristic diamond Raman line is obse
rved, close to grain boundaries an additional feature at 1326 cm(-1) is det
ected. Such a Raman component may be related to the presence of hexagonal m
icrophases formed by a defect-induced symmetry modification of the diamond
lattice. Grain boundaries appear also to be affected by a strongly anisotro
pic stress, which induces a frequency shift and splitting of the Raman peak
. Stress configurations compatible with the experimental observations are p
roposed and discussed.