First- and second-order Raman scattering from semi-insulating 4H-SiC

Citation
Jc. Burton et al., First- and second-order Raman scattering from semi-insulating 4H-SiC, PHYS REV B, 59(11), 1999, pp. 7282-7284
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
59
Issue
11
Year of publication
1999
Pages
7282 - 7284
Database
ISI
SICI code
0163-1829(19990315)59:11<7282:FASRSF>2.0.ZU;2-X
Abstract
We have measured the first- and second-order Raman spectra from semi-insula ting 4H-SiC at room temperature under nonresonant excitation. The results a re compared with Raman spectra of n-type doped 4H- and 6H-SiC. The second-o rder spectra for both 4H- and 6H-SiC contain an acoustic branch and an opti cal branch, which is clearly dependent on SiC polytype. The measured two-ph onon spectra are assigned by comparison with theoretical calculations. [S01 63-1829(99)03211-7].