G. Kumaraswamy et al., Novel flow apparatus for investigating shear-enhanced crystallization and structure development in semicrystalline polymers, REV SCI INS, 70(4), 1999, pp. 2097-2104
An instrument to study the effects of shearing on the crystallization proce
ss in semicrystalline polymers is described. It can impose transient stress
es similar to those encountered in polymer processing and provides in situ
monitoring of microstructure development during and after cessation of flow
. Box-like wall shear stress profiles (rise and fall times under 50 ms with
maximum wall shear stress on the order of 0.1 MPa) can be applied for cont
rolled durations. A unique feature of our device is that it accommodates a
wide variety of real-time probes of structure such as visible and infrared
polarimetry and light and x-ray scattering measurements. The design also al
lows us to retrieve the sample for ex situ optical and electron microscopy.
Data are acquired with millisecond resolution enabling us to record the ex
tent of shear deformation of the polymer melt during the pressure pulse. Ou
r device works with small sample quantities (as little as 5 g; each experim
ent takes similar to 500 mg) as opposed to the kilogram quantities required
by previous instruments capable of imposing comparable deformations. This
orders-of-magnitude reduction in the sample size allows us to study model p
olymers and new developmental resins, both of which are typically available
only in gram-scale quantities. The compact design of the shear cell makes
it possible to transport it to synchrotron light sources for in situ x-ray
scattering studies of the evolution of the crystalline structure. Thus, our
device is a valuable new tool that can be used to evaluate the crystalliza
tion characteristics of resins with experimental compositions or molecular
architectures when subjected to processing-like flow conditions. We demonst
rate some of the features of this device by presenting selected results on
isotactic polypropylenes. (C) 1999 American Institute of Physics. [S0034-67
48(99)04504-9].