Anodization of undoped amorphous silicon by electrical injection of holes

Citation
M. Gros-jean et al., Anodization of undoped amorphous silicon by electrical injection of holes, SOL ST COMM, 109(10), 1999, pp. 643-648
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SOLID STATE COMMUNICATIONS
ISSN journal
00381098 → ACNP
Volume
109
Issue
10
Year of publication
1999
Pages
643 - 648
Database
ISI
SICI code
0038-1098(19990219)109:10<643:AOUASB>2.0.ZU;2-D
Abstract
Electrochemical etching of undoped hydrogenated amorphous silicon layers in HF solutions was performed in the "injection regime". Holes necessary for the anodization of silicon are produced by electrical injection from a p(+) back contact rather than by p-type doping of the material. We have found t hat there is no measurable injection of electrons from the electrolyte. The injection regime is responsible for a new macro-instability, with the form ation of large channels across the film which hinder the elaboration of a m icroporous silicon layer. (C) 1999 Elsevier Science Ltd. All rights reserve d.