Electrochemical etching of undoped hydrogenated amorphous silicon layers in
HF solutions was performed in the "injection regime". Holes necessary for
the anodization of silicon are produced by electrical injection from a p(+)
back contact rather than by p-type doping of the material. We have found t
hat there is no measurable injection of electrons from the electrolyte. The
injection regime is responsible for a new macro-instability, with the form
ation of large channels across the film which hinder the elaboration of a m
icroporous silicon layer. (C) 1999 Elsevier Science Ltd. All rights reserve
d.