C. Henneuse-boxus et al., Surface functionalization of PEEK films studied by time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy, SURF INT AN, 27(3), 1999, pp. 142-152
Using the wet chemistry method, the surface of poly(aryl ether ether ketone
) (PEEK) him aas selectively modified to produce PEEE-OH, PEEE-COOH, PEEK-g
lutamine, PEEK-NH2 and PEEK-SO3H samples displaying, respectively hydroxyl,
carboxyl, amino acid, amine and sulphonyl functions. All the samples were
analysed by XPS and time-of-flight (ToF) SIMS; the experimental data provid
ed by both techniques were in good agreement, and allowed the chemical natu
re and the yield of the functional groups introduced by the different surfa
ce derivatizations to be determined. Copyright (C) 1999 John Wiley & Sons,
Ltd.