Surface functionalization of PEEK films studied by time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy

Citation
C. Henneuse-boxus et al., Surface functionalization of PEEK films studied by time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy, SURF INT AN, 27(3), 1999, pp. 142-152
Citations number
47
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE AND INTERFACE ANALYSIS
ISSN journal
01422421 → ACNP
Volume
27
Issue
3
Year of publication
1999
Pages
142 - 152
Database
ISI
SICI code
0142-2421(199903)27:3<142:SFOPFS>2.0.ZU;2-U
Abstract
Using the wet chemistry method, the surface of poly(aryl ether ether ketone ) (PEEK) him aas selectively modified to produce PEEE-OH, PEEE-COOH, PEEK-g lutamine, PEEK-NH2 and PEEK-SO3H samples displaying, respectively hydroxyl, carboxyl, amino acid, amine and sulphonyl functions. All the samples were analysed by XPS and time-of-flight (ToF) SIMS; the experimental data provid ed by both techniques were in good agreement, and allowed the chemical natu re and the yield of the functional groups introduced by the different surfa ce derivatizations to be determined. Copyright (C) 1999 John Wiley & Sons, Ltd.