Determination of impurity lattice sites in single crystals using PIXE channeling

The channeling technique is an interesting and powerful tool for the determ ination of impurity lattice sites in single crystals, Since the investigati on of light impurities in heavy matrices using the Rutherford backscatterin g spectrometry/channeling technique is often very difficult or impossible, the combination of particle induced x-ray emission (PIXE) with the channeli ng effect is an important alternative, Experimental results for various imp urities in cubic and non-cubic crystals are presented to show the feasibili ty of the method, In order to permit the quantitative analysis of such PIXE /channeling data, the computer code CASSIS was developed and successfully a pplied, Copyright (C) 1999 John Wiley & Sons, Ltd.