V. Stankevic et C. Simkevicius, APPLICATION OF ALUMINUM FILMS AS TEMPERATURE SENSORS FOR THE COMPENSATION OF OUTPUT THERMAL SHIFT OF SILICON PIEZORESISTIVE PRESSURE SENSORS, Sensors and actuators. A, Physical, 71(3), 1998, pp. 161-166
Aluminum thin film resistors are proposed for use as temperature senso
rs for the compensation of the thermal sensitivity and offset shift of
pressure sensor output. An experimental investigation of Al films wit
h different thicknesses and heat treatment was carried out in order to
optimize the electric parameters of such temperature resistors. It wa
s found that films with a thickness 1.2 mu m and thermal etched at 330
degrees C for 72 h have good long-time stability, a specific resistan
ce of 2.85 mu Omega cm and a temperature coefficient of resistance of
4.33 x 10(-3)/degrees C. Th, obtained results indicate that Al resisto
rs can be used in an electrical circuit for the passive temperature co
mpensation of the thermal shift of pressure sensor output within a tem
perature range of up to 125 degrees C. (C) 1998 Elsevier Science S.A.
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