APPLICATION OF ALUMINUM FILMS AS TEMPERATURE SENSORS FOR THE COMPENSATION OF OUTPUT THERMAL SHIFT OF SILICON PIEZORESISTIVE PRESSURE SENSORS

Citation
V. Stankevic et C. Simkevicius, APPLICATION OF ALUMINUM FILMS AS TEMPERATURE SENSORS FOR THE COMPENSATION OF OUTPUT THERMAL SHIFT OF SILICON PIEZORESISTIVE PRESSURE SENSORS, Sensors and actuators. A, Physical, 71(3), 1998, pp. 161-166
Citations number
12
Categorie Soggetti
Engineering, Eletrical & Electronic","Instument & Instrumentation
ISSN journal
09244247
Volume
71
Issue
3
Year of publication
1998
Pages
161 - 166
Database
ISI
SICI code
0924-4247(1998)71:3<161:AOAFAT>2.0.ZU;2-L
Abstract
Aluminum thin film resistors are proposed for use as temperature senso rs for the compensation of the thermal sensitivity and offset shift of pressure sensor output. An experimental investigation of Al films wit h different thicknesses and heat treatment was carried out in order to optimize the electric parameters of such temperature resistors. It wa s found that films with a thickness 1.2 mu m and thermal etched at 330 degrees C for 72 h have good long-time stability, a specific resistan ce of 2.85 mu Omega cm and a temperature coefficient of resistance of 4.33 x 10(-3)/degrees C. Th, obtained results indicate that Al resisto rs can be used in an electrical circuit for the passive temperature co mpensation of the thermal shift of pressure sensor output within a tem perature range of up to 125 degrees C. (C) 1998 Elsevier Science S.A. All rights reserved.