Chemical vapor deposited (CVD) polycrystalline diamond is inexpensive
and can become a commercially viable piezoresistive sensor material if
its typical gauge factor (GF) exceeds that of crystalline Si and SE.
In this paper, a study of GF of B-doped polycrystalline diamond film l
eads to an intra-grain GF above 4000, which is comparable to GF of sin
gle crystal p-type diamond. This result, reported for the first time,
shows that large-grain (50-80 mu m) CVD diamond can be used to build i
nexpensive ultra-high sensitivity piezoresistive sensors. (C) 1998 Els
evier Science S.A. All rights reserved.