COMPOSITION TUNABLE MEMORY AND THRESHOLD SWITCHING IN AL20ASXTE80-X SEMICONDUCTING GLASSES

Citation
S. Murugavel et S. Asokan, COMPOSITION TUNABLE MEMORY AND THRESHOLD SWITCHING IN AL20ASXTE80-X SEMICONDUCTING GLASSES, Journal of materials research, 13(10), 1998, pp. 2982-2987
Citations number
37
Categorie Soggetti
Material Science
ISSN journal
08842914
Volume
13
Issue
10
Year of publication
1998
Pages
2982 - 2987
Database
ISI
SICI code
0884-2914(1998)13:10<2982:CTMATS>2.0.ZU;2-V
Abstract
I-V studies indicate a composition dependent switching behavior (Memor y or Threshold) in bulk Al20AsxTe80-x glasses, which is determined by the coordination and composition of aluminum. Investigations on temper ature and thickness dependence of switching and structural studies on switched samples suggest thermal and electronic mechanisms of switchin g for the memory and threshold samples, respectively. The present resu lts also show that these samples have a wider composition range of thr eshold behavior with lower threshold voltages compared to other thresh old samples.