MODELING RADIATION-INDUCED MOBILITY DEGRADATION IN MOSFETS

This paper analyses the relationship between two forms of channel-carr ier mobility models, both of them employing linear combinations of oxi de- and interface-trapped charge densities. The original form of this model is based on the overall densities-of oxide- and interface-trappe d charge, while another form of this model uses the radiation-induced charge densities as a convenient way of expressing the radiation-induc ed mobility degradation. It is shown that the radiation-degradation fo rm of the mobility model employs coefficients which are dependent on b oth the bulk and the initial mobility values. This fact is very import ant in terms of proper analysis of experimental results on radiation-i nduced mobility degradation.