PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY (PICTS) OF DEEP LEVELS INELECTRODEPOSITED CDTE-FILMS

The PICTS technique in conjunction with a highly absorptive excitation wavelength is used to characterize and to distinguish the electron an d hole traps in electrodeposited CdTe films. All the deep levels measu red are within two deep (donor-type and acceptor-type) energy bands an d are related to only native defects and their complexes with chlorine . Except chlorine, no other trace-impurity levels could be detected, i mplying the effectiveness of electropurification of the bath solution prior to deposition of CdTe. Some results related to the effect of dif ferent annealing processes on the spectrum of deep levels are also dis cussed.