PHOTON SCANNING TUNNELING MICROSCOPE WITH A NONRESONANCE ATOMIC-FORCEREGIME

Authors
LAPSHIN DA
Citation
Da. Lapshin, PHOTON SCANNING TUNNELING MICROSCOPE WITH A NONRESONANCE ATOMIC-FORCEREGIME, Technical physics, 43(9), 1998, pp. 1055-1061
Citations number
25
Categorie Soggetti
Physics, Applied
Journal title
Technical physics → ACNP
ISSN journal
10637842
Volume
43
Issue
9
Year of publication
1998
Pages
1055 - 1061
Database
ISI
SICI code
1063-7842(1998)43:9<1055:PSTMWA>2.0.ZU;2-T
Abstract
A design of a photon scanning tunneling microscope is presented. The s hear-force regime and the advantages of nonresonance excitation of the probe are discussed in detail. II is suggested that the replica metho d be used to estimate the size of the active part of the probe. (C) 19 98 American Institute of Physics. [S1063-7842(98)01109-X].