Wc. Ward et al., DIRECT-SCANNING ALPHA-SPECTROMETER FOR AMERICIUM AND PLUTONIUM CONTAMINATION ON HIGHLY-ENRICHED URANIUM SURFACES, Journal of radioanalytical and nuclear chemistry, 235(1-2), 1998, pp. 5-10
Trace Pu-239 and Am-241 contamination on a surface whose alpha count i
s dominated by U-235 and U-234 decay has been successfully quantified
by counting swipes in external alpha-spectroscopy chambers. The swipe
process, however, is labor intensive and subject to uncertainties in t
he swiping process as well as degraded spectral resolution due to the
presence of the swipe material. A multichannel instrument for automate
d in situ measurements of interior and exterior contamination has been
developed which incorporates a rotary table, 13 fixed ion-implanted s
ilicon detectors, and spectroscopy electronics. Custom software was wr
itten to allow alpha-spectrometer to function as a virtual instrument
in the LabView environment. This system gives improved speed and resol
ution as well as a complete log of the location of areas of high surfa
ce contamination, a feature not practical to obtain by other methods,
and one which opens the possibility of long term studies such as Pu ou
tgrowth evaluation employing the instrument. We present performance da
ta as well as system integration, calibration, control and dynamic geo
metric efficiency calculations related to the design of this and next
generation systems.