OBSERVATION OF COHERENT HYBRID REFLECTION WITH SYNCHROTRON-RADIATION

High resolution synchrotron radiation has been used to investigate the occurrence of coherent hybrid reflections (CHR) in the In0.49Ga0.51P/ GaAs(001) structure. Several phi scans at the 002 layer reflection wer e carried out. The scanned phi intervals are correlated by the axis sy mmetry and [001] should present the same pattern. A break in the symme try is observed due to constructive/destructive interference of the hy brid amplitudes with the amplitude from the 002 layer reflection. The effects of substrate miscut and interface distance are taken into acco unt to explain the observed patterns. The application of CHR as a high sensitive tool to analyze epitaxial growth is discussed. (C) 1998 Ame rican Institute of Physics. [S0003-6951(98)03841-8].