PROBING INTERFACIAL AND BULK MAGNETIC HYSTERESIS IN ROUGHENED COFE THIN-FILMS

Authors
FREELAND JW BUSSMANN K LUBITZ P IDZERDA YU CAO CC
Citation
Jw. Freeland et al., PROBING INTERFACIAL AND BULK MAGNETIC HYSTERESIS IN ROUGHENED COFE THIN-FILMS, Applied physics letters, 73(15), 1998, pp. 2206-2208
Citations number
24
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
73
Issue
15
Year of publication
1998
Pages
2206 - 2208
Database
ISI
SICI code
0003-6951(1998)73:15<2206:PIABMH>2.0.ZU;2-Y
Abstract
The hysteretic behavior of interfacial magnetic moments for CoFe thin films with varying roughness is determined in an element specific mann er by monitoring the applied magnetic field dependence of the specular and off-specular (diffuse) contributions to the x-ray resonant magnet ic scattering signal. Increasing the interfacial roughness generates a larger variation of the relative coercive field associated with the i nterfacial moment in comparison to the bulk. (C) 1998 American Institu te of Physics. [S0003-6951(98)00941-3].