Ac. Jones et al., LIQUID INJECTION MOCVD OF ZIRCONIUM DIOXIDE USING A NOVEL MIXED-LIGAND ZIRCONIUM PRECURSOR, CHEMICAL VAPOR DEPOSITION, 4(5), 1998, pp. 197-201
Thin films of ZrO2 have been deposited by liquid injection MOCVD using
tetrahydrofuran solutions of the novel mixed ligand precursor Zr-2((O
Pr)-Pr-i)(6)(thd)(2) (thd = 2,2,6,6,-tetramethyl-3,5-heptanedionate) O
xide growth was observed over an unusually wide range of temperatures
from 250 degrees C to at least 600 degrees C. Optimized growth of ZrO2
occurred between 350 degrees C and 550 degrees C, which is considerab
ly lower than the optimum temperature for deposition from the conventi
onal Zr(thd)(4) precursor. Analysis of the films by Auger electron spe
ctroscopy showed that carbon was present at levels of between similar
to 2 at.-% and 11 at.-%, depending on substrate temperature and oxygen
concentration in the gas phase.