RADIATION TOLERANCE-TESTS OF COMPONENTS FOR THE FERMI MICROCHIP MODULE

Citation
J. Molnar et al., RADIATION TOLERANCE-TESTS OF COMPONENTS FOR THE FERMI MICROCHIP MODULE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 143(4), 1998, pp. 536-546
Citations number
10
Categorie Soggetti
Instument & Instrumentation","Nuclear Sciences & Tecnology","Physics, Atomic, Molecular & Chemical","Physics, Nuclear
ISSN journal
0168583X
Volume
143
Issue
4
Year of publication
1998
Pages
536 - 546
Database
ISI
SICI code
0168-583X(1998)143:4<536:RTOCFT>2.0.ZU;2-R
Abstract
A project has been in progress to provide information on radiation har dness properties of components to be used in the Front End Readout MIc rosystem (FERMI) collaboration. Neutron activation studies as well as neutron and gamma radiation tolerance tests have been carried out on d igital circuit components, prepared with different (partly radiation h ardened) technologies, using 3.7 MeV average energy neutron and Co-60 gamma radiation. The test board and the irradiation conditions as well as the data acquisition and evaluation program are described. (C) 199 8 Elsevier Science B.V. All rights reserved.