TXRF ANALYSIS OF SOLUTION SAMPLES USING POLYESTER FILM AS A DISPOSABLE SAMPLE-CARRIER COVER

The performance of polyester film was examined as a disposable cover o f the sample-carrier (silicon wafer). The cover offers convenience and economy for the total reflection X-ray fluorescence (TXRF) analysis o f solution samples. Moreover, the measurement of Al K-alpha (1.487 keV ) and P K-alpha (2.013 keV) peaks is possible because of the reduction of Si K-alpha X-rays (1.740 keV) from the sample-carrier. Not only th e trace elements (Cr, Mn, Co, Ni and Cu) but also the low sensitivity elements (Al and P) in JSS iron and steel standard samples were succes sfully analyzed.