S. Kugler et al., STRUCTURE OF EVAPORATED PURE AMORPHOUS-SILICON - NEUTRON-DIFFRACTION AND REVERSE MONTE-CARLO INVESTIGATIONS, Physical review. B, Condensed matter, 48(10), 1993, pp. 7685-7688
A neutron-diffraction measurement in the 0-23 angstrom-1 inverse space
interval was performed on pure amorphous Si. With the structure facto
r obtained experimentally three-dimensional models were constructed by
reverse Monte Carlo simulation for the determination of the atomic st
ructure of a-Si. The radial distribution function was calculated direc
tly from the large-scale models and was derived traditionally from the
se wide range spectra, as well.