INTERFACE ROUGHNESS LOCALIZATION IN QUANTUM-WELLS AND QUANTUM WIRES

Citation
I. Rasnik et al., INTERFACE ROUGHNESS LOCALIZATION IN QUANTUM-WELLS AND QUANTUM WIRES, Physical review. B, Condensed matter, 58(15), 1998, pp. 9876-9880
Citations number
9
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
58
Issue
15
Year of publication
1998
Pages
9876 - 9880
Database
ISI
SICI code
0163-1829(1998)58:15<9876:IRLIQA>2.0.ZU;2-Y
Abstract
We studied the effects of interface localization due to microroughness in a sample presenting a quantum well and a quantum wire. We measured the magnetoluminescence at different temperatures and analyzed the re sults with a model where the average microroughness, the magnetic fiel d, and the excitonic effects are treated within the same level of appr oximation. We were able to extract a quantitative estimate for the exc iton localization due to microroughness. Our results also demonstrate the efficiency of the temperature to detrap excitons from the interfac e roughness localization. [S0163-1829(98)03439-0].