TEMPERATURE-DEPENDENCE OF THE OPTICAL-ABSORPTION EDGE IN C-60 THIN-FILMS

Citation
T. Gotoh et al., TEMPERATURE-DEPENDENCE OF THE OPTICAL-ABSORPTION EDGE IN C-60 THIN-FILMS, Physical review. B, Condensed matter, 58(15), 1998, pp. 10060-10063
Citations number
21
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
58
Issue
15
Year of publication
1998
Pages
10060 - 10063
Database
ISI
SICI code
0163-1829(1998)58:15<10060:TOTOEI>2.0.ZU;2-N
Abstract
The optical absorption edge of semiconductor C-60 films is studied in a wide temperature range of 8.8-470 K. We find three temperature regim es for both the optical gap E-o and the Urbach tail parameter E-u: in the range T<150 K, they do not change; 150<T<260 K, they change gradua lly; and T>260 K, they change rapidly. We also find that the subgap ab sorption increases with prolonged exposure of the film to air but the Urbach tail parameter E-u is not affected. The results are discussed i n terms of the relation of the electron density of states to the molec ular orientational disorder and the structural phase transition. [SO16 3-1829(98)05939-6].