Ke. Gray et al., EXPLANATION OF LOW CRITICAL CURRENTS IN FLAT, BULK VERSUS MEANDERING,THIN-FILM [001]-ILT BICRYSTAL GRAIN-BOUNDARIES IN YBA2CU3O7, Physical review. B, Condensed matter, 58(14), 1998, pp. 9543-9548
Thin-film and bulk [001] tilt, bicrystal grain boundaries in YBa2Cu3O7
exhibit a strong dependence of critical current density on misorienta
tion angle. What is particularly difficult to understand is its thirty
times lower magnitude in bulk grain boundaries which are microscopica
lly more perfect, i.e., flatter, minimally faceted, and free of impuri
ty phases. A plausible explanation, based on differences of the pinnin
g of Josephson vortices in these grain boundary types, is proposed her
e. [S0163-1829(98)05438-1].