EXPLANATION OF LOW CRITICAL CURRENTS IN FLAT, BULK VERSUS MEANDERING,THIN-FILM [001]-ILT BICRYSTAL GRAIN-BOUNDARIES IN YBA2CU3O7

Citation
Ke. Gray et al., EXPLANATION OF LOW CRITICAL CURRENTS IN FLAT, BULK VERSUS MEANDERING,THIN-FILM [001]-ILT BICRYSTAL GRAIN-BOUNDARIES IN YBA2CU3O7, Physical review. B, Condensed matter, 58(14), 1998, pp. 9543-9548
Citations number
29
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
58
Issue
14
Year of publication
1998
Pages
9543 - 9548
Database
ISI
SICI code
0163-1829(1998)58:14<9543:EOLCCI>2.0.ZU;2-#
Abstract
Thin-film and bulk [001] tilt, bicrystal grain boundaries in YBa2Cu3O7 exhibit a strong dependence of critical current density on misorienta tion angle. What is particularly difficult to understand is its thirty times lower magnitude in bulk grain boundaries which are microscopica lly more perfect, i.e., flatter, minimally faceted, and free of impuri ty phases. A plausible explanation, based on differences of the pinnin g of Josephson vortices in these grain boundary types, is proposed her e. [S0163-1829(98)05438-1].