S. Daolio et al., SECONDARY-ION MASS-SPECTROMETRY CHARACTERIZATION OF IRO2-TA2O5 THIN-FILMS - EFFECT OF RELATIVE COMPOSITION ON ELECTRODE PROPERTIES, Rapid communications in mass spectrometry, 12(20), 1998, pp. 1574-1579
IrO2 and Ta2O5 mixed oxide coatings were deposited on Ti supports in o
rder to fabricate dimensionally stable electrodes used in chloro-alkal
i technology. Secondary ion mass spectrometry (SIMS) and electrochemic
al experiments were carried out in order to characterize these materia
ls. Electrochemical tests found the highest electrocatalytic activity
for 50% IrO2-50% Ta2O5 electrodes. SIMS analyses are in harmony with t
hese results, and it is shown that IrO2 is more diluted on the surface
for noble metal oxide concentrations higher than 50%. Finally, it was
observed by SIMS that support material migration was favoured at the
highest concentrations of Ta2O5 stabilizer. (C) 1998 John Wiley & Sons
, Ltd.