SILICON SPECIATION USING REVERSED-PHASE HIGH-PERFORMANCE LIQUID-CHROMATOGRAPHY INDUCTIVELY-COUPLED PLASMA-ATOMIC EMISSION-SPECTROMETRY - RADIAL VERSUS AXIAL VIEWING

Citation
L. Ebdon et al., SILICON SPECIATION USING REVERSED-PHASE HIGH-PERFORMANCE LIQUID-CHROMATOGRAPHY INDUCTIVELY-COUPLED PLASMA-ATOMIC EMISSION-SPECTROMETRY - RADIAL VERSUS AXIAL VIEWING, Spectrochimica acta, Part B: Atomic spectroscopy, 53(6-8), 1998, pp. 859-865
Citations number
25
Categorie Soggetti
Spectroscopy
ISSN journal
05848547
Volume
53
Issue
6-8
Year of publication
1998
Pages
859 - 865
Database
ISI
SICI code
0584-8547(1998)53:6-8<859:SSURHL>2.0.ZU;2-1
Abstract
The speciation of polar silicon compounds by high performance liquid c hromatography using both radially viewed and axially viewed inductivel y coupled plasma (ICP) atomic emission spectrometers, with solid state detection, is described. Optimum operating conditions for the direct aspiration of an organic mobile phase were evaluated for the two modes of viewing and limits of detection, background equivalent concentrati ons and relative standard deviations of the blank were calculated to c ompare radially viewed and axially viewed ICPs directly. It was found that no appreciable improvements in detection limits were observed whe n viewing the plasma axially. This is attributed to the fact that the plasma noise cannot be eliminated for 'end on' viewing through the ent ire optical path length. Various methods for data acquisition are also described. (C) 1998 Published by Elsevier Science B.V. All rights res erved.