A NOVEL ANALYTICAL EXPRESSION OF SATURATION INTENSITY OF INGAASP TAPERED TRAVELING-WAVE SEMICONDUCTOR-LASER AMPLIFIER STRUCTURES

Citation
H. Ghafourishiraz et al., A NOVEL ANALYTICAL EXPRESSION OF SATURATION INTENSITY OF INGAASP TAPERED TRAVELING-WAVE SEMICONDUCTOR-LASER AMPLIFIER STRUCTURES, IEEE photonics technology letters, 10(11), 1998, pp. 1545-1547
Citations number
7
Categorie Soggetti
Optics,"Physics, Applied
ISSN journal
10411135
Volume
10
Issue
11
Year of publication
1998
Pages
1545 - 1547
Database
ISI
SICI code
1041-1135(1998)10:11<1545:ANAEOS>2.0.ZU;2-1
Abstract
We have proposed a novel approximate analytical expression for saturat ion intensity for tapered traveling-wave semiconductor laser amplifier structures. The application of this analytical expression of saturati on intensity has been demonstrated by considering the effect of gain s aturation on polarization sensitivity of two tapered amplifier structu res, linear and exponential tapered amplifier structures. It is found that polarization sensitivity of the tapered amplifier structure is se veral decibels higher than that of passive tapered waveguides in unsat urated condition. Polarization sensitivity of the two tapered amplifie r structures has also been investigated in a highly saturated conditio n. The combined effects of mode conversion and gain saturation on fund amental TE gain have also been investigated using the proposed analyti cal expression for saturation intensity.