TEMPERATURE-PROGRAMMED DESORPTION STUDY OF MOLECULAR-OXYGEN ADSORBED ON MFI-TYPE ZEOLITES

Citation
Mh. Kim et al., TEMPERATURE-PROGRAMMED DESORPTION STUDY OF MOLECULAR-OXYGEN ADSORBED ON MFI-TYPE ZEOLITES, The Korean journal of chemical engineering, 15(5), 1998, pp. 566-569
Citations number
16
Categorie Soggetti
Engineering, Chemical",Chemistry
ISSN journal
02561115
Volume
15
Issue
5
Year of publication
1998
Pages
566 - 569
Database
ISI
SICI code
0256-1115(1998)15:5<566:TDSOMA>2.0.ZU;2-Y
Abstract
The adsorption of molecular oxygen at room temperature on the proton f orm of MFI zeolites with different Si/Al ratios has been investigated by temperature-programmed desorption (TPD). The internal Si-OH defects (silanol groups) in these zeolites are found to serve as O-2 adsorpti on sites. The apparent activation energies (17.5-21.8 kcal . mol(-1)) of desorption determined from O-2 TPD measurements reveal that the ext ent of interactions between the Si-OH defects and the adsorbed O-2 mol ecules becomes weaker with decreasing Al content in the zeolite.