SURFACE MODIFICATION OF MOSE2 IN SOLUTION USING A COMBINED TECHNIQUE OF SCANNING-TUNNELING-MICROSCOPY INDENTATION WITH ELECTROCHEMICAL ETCHING

Citation
T. Ohmori et al., SURFACE MODIFICATION OF MOSE2 IN SOLUTION USING A COMBINED TECHNIQUE OF SCANNING-TUNNELING-MICROSCOPY INDENTATION WITH ELECTROCHEMICAL ETCHING, Langmuir, 14(21), 1998, pp. 6287-6290
Citations number
15
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
07437463
Volume
14
Issue
21
Year of publication
1998
Pages
6287 - 6290
Database
ISI
SICI code
0743-7463(1998)14:21<6287:SMOMIS>2.0.ZU;2-H
Abstract
Surface modification of MoSe2 has been accomplished in an electrochemi cal environment by a combined technique of scanning tunneling microsco py (STM) indentation with the following etching reaction. The artifici al holes (defects), amde by STPYI indentation, could successfully serv e as sites that initiated the electrochemical etching reaction that re sulted in growth of the holes. The etching progressed in a highly anis otropic way, mainly occurring toward directions within the basal plane of the MoSe2, and predominantly leaving the step edges with equilater al triangular shapes. The etched holes had depths of a few van der Waa ls layers of the MoSe2, irrespective of the depths of the artificially made initial holes. The present technique could provide favorable opp ortunities not only for nanometer scale lithography in solution but al so for fundamental studies on the mechanism of the etching processes a t layered transition metal dichalcogenide materials.