T. Ohmori et al., SURFACE MODIFICATION OF MOSE2 IN SOLUTION USING A COMBINED TECHNIQUE OF SCANNING-TUNNELING-MICROSCOPY INDENTATION WITH ELECTROCHEMICAL ETCHING, Langmuir, 14(21), 1998, pp. 6287-6290
Surface modification of MoSe2 has been accomplished in an electrochemi
cal environment by a combined technique of scanning tunneling microsco
py (STM) indentation with the following etching reaction. The artifici
al holes (defects), amde by STPYI indentation, could successfully serv
e as sites that initiated the electrochemical etching reaction that re
sulted in growth of the holes. The etching progressed in a highly anis
otropic way, mainly occurring toward directions within the basal plane
of the MoSe2, and predominantly leaving the step edges with equilater
al triangular shapes. The etched holes had depths of a few van der Waa
ls layers of the MoSe2, irrespective of the depths of the artificially
made initial holes. The present technique could provide favorable opp
ortunities not only for nanometer scale lithography in solution but al
so for fundamental studies on the mechanism of the etching processes a
t layered transition metal dichalcogenide materials.