A series of experiments was carried out to optimize the pulsed laser d
eposition parameters for the fabrication of high quality NiTi shape me
mory alloy thin films. Smooth NiTi shape memory alloy thin films were
deposited at high growth rate with optimum deposition parameters bused
on the analysis of the relationships among the morphology of the targ
et surface and the deposited thin film, the laser energy, the target-s
ubstrate distance, the thin film composition and its growth rate. Crys
tal structures and phase transformation temperatures of the annealed N
i-Ti-49.7(50.3) thin film were characterized by using X-ray diffractio
n and differential scanning calorimetry, respectively. The martensitic
transformation temperature of the crystallized Ni49.7Ti50.3 thin film
is found to be lower than room temperature and 27 degrees C lower tha
n that of the NiTi target material. These results are attributed to th
e refined grain size of the thin film and its composition, which devia
tes slightly from Ni50Ti50. (C) 1998 Elsevier Science S.A. All rights
reserved.