CuCl microcrystals-doped SiO2 glass thin films were successfully prepa
red by rf(radio frequency)-sputtering method. The formation of CuCl mi
crocrystals in the glass thin films has been explored by X-ray diffrac
tion, transmission electron microscopy and X-ray photoelectron spectro
scopy. The quantum size effect in CuCl was found from the blue shift o
f exciton absortion peaks. Although some influence of the matrix on th
e temperature dependent linewidth of the exciton peaks was observed, t
he relationship between the amount of blue shift of the absorption edg
e and the diameter of the CuCl microcrystals satisfied the theory for
the quantum-size confinement of the exciton.