SPIN-POLARIZED X-RAY-EMISSION SPECTROSCOPY OF CAPPED THIN CO FILMS ONCU(100)

Citation
U. Pustogowa et al., SPIN-POLARIZED X-RAY-EMISSION SPECTROSCOPY OF CAPPED THIN CO FILMS ONCU(100), Solid state communications, 108(6), 1998, pp. 343-348
Citations number
27
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
00381098
Volume
108
Issue
6
Year of publication
1998
Pages
343 - 348
Database
ISI
SICI code
0038-1098(1998)108:6<343:SXSOCT>2.0.ZU;2-H
Abstract
The theory of valence band X-ray emission spectroscopy (XES) is discus sed in terms of spin-polarized fully relativistic multiple scattering. In comparison to the non spin-polarized case new theoretical features are presented with particular emphasis on the dependence of the inten sity on the polarization of the emitted photon. Applications to the L- 3 XES of a Co monolayer on Cu(100) substrate as capped by a monolayer of various 3d, 4d, and 5d transition metals are shown since such overl ayer systems display systematic variations of the magnetic moment in t he Co layer as well as in the cap layer. These changes are clearly map ped in the calculated XES and discussed in terms of transition cross s ections and local densities of states. (C) 1998 Elsevier Science Ltd. All rights reserved.