R. Nowak et al., COMPARISON OF IMPLANTATION WITH NI2+ AND AU2+ IONS ON THE INDENTATIONRESPONSE OF SAPPHIRE, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 253(1-2), 1998, pp. 167-177
The mechanical behavior of sapphire modified by bombardment with energ
etic Ni2+ and Au2+ ions (E = 3 MeV, fluence of 2 x 10(16) cm(-2)) was
examined by means of ultra micro-indentation in the (10 (1) over bar 0
) plane of virgin and ion-treated crystal. The variation of hardness a
nd Young's modulus with depth of penetration of indenters with pointed
or spherical tipped was determined. The spherical tip indenter reveal
ed a dramatic difference in the response of the virgin (overload drive
n 'pop-in' of the plastic deformation) and implanted (smooth transitio
n from the elastic to plastic response) sapphire. Microscopic observat
ions of the indented surface revealed slip/twin traces close to the im
pressions in the unimplanted material, but not in ion-modified crystal
s. The results were rationalized in terms of the ease of plastic defor
mation or twinning as influenced by irradiation. It was concluded that
the paucity of defects in virgin sapphire leads to the overload condi
tion for the nucleation of plastic deformation at stresses approaching
the theoretical strength of 15-20 GPa. Extensive plastic deformation
sets in at a stress of 6.25 GPa in Ni-implanted crystal, and large dis
location pile-ups are responsible for the significant hardening observ
ed, while the Au-implanted material suffered severe lattice damage res
ulting in a significant reduction of modulus and contact pressure to i
nitiate plastic deformation at 2.25 GPa. The results point towards the
appropriateness of indenters with very small spherical tips as the me
ans to characterize the mechanical properties of ion-beam modified sur
faces. (C) 1998 Elsevier Science S.A. All rights reserved.