EFFECTS OF MECHANICAL DEFORMATION ON CRITICAL-CURRENT OF BI-2223 AG TAPES/

The influence of mechanical deformation on critical current has been s tudied, in order to assess the effect of sample handling on the curren t carrying capabilities of Bi-2223/Ag tapes. Transport critical curren t was measured at 77 K using a 1 mu V cm(-1) criterion. The effect of progressive bending of the tapes on grain connectivity and flux pinnin g were investigated by measuring I-c against H. It was observed that b ending can affect weak and strong links to a different degree. Damaged samples have a low J(c0), but often have a large critical current whi ch is carried through strongly linked paths, compared to I-c carried t hrough weak links. The influence of tensile deformation on I-c0 was al so studied, I-c0 was found not to degrade until the deformation of the tape approached its elastic limit.