ULTRAFAST BEAM-DEFLECTION METHOD AND ITS APPLICATION FOR MEASURING THE TRANSIENT REFRACTIVE-INDEX OF MATERIALS

Authors
ALBRECHT HS HEIST P KLEINSCHMIDT J LAP DV
Citation
Hs. Albrecht et al., ULTRAFAST BEAM-DEFLECTION METHOD AND ITS APPLICATION FOR MEASURING THE TRANSIENT REFRACTIVE-INDEX OF MATERIALS, Applied physics. B, Photophysics and laser chemistry, 57(3), 1993, pp. 193-197
Citations number
21
Categorie Soggetti
Physics, Applied
Journal title
Applied physics. B, Photophysics and laser chemistry → ACNP
ISSN journal
07217269
Volume
57
Issue
3
Year of publication
1993
Pages
193 - 197
Database
ISI
SICI code
0721-7269(1993)57:3<193:UBMAIA>2.0.ZU;2-K
Abstract
We represent an ultrafast beam-deflection method as a simple and power ful tool for the time-resolved measurement of induced changes of the r efractive index in the order of DELTAn = 10(-5). The method is applied for measuring the changes of components of the refractive index paral lel and perpendicular to the pump-pulse polarization on a femtosecond time scale. Fused silica and CS2 are used as samples for demonstrating our method.