C. Engler et W. Lorenz, ELECTRONIC CHARGE-DENSITY INJECTION IN SEMICONDUCTOR INTERFACIAL PROCESSES - QUANTUM-CHEMICAL PROOF OF INJECTION DYNAMICS, Zeitschrift für physikalische Chemie, 205, 1998, pp. 15-32
Citations number
35
Categorie Soggetti
Chemistry Physical","Physics, Atomic, Molecular & Chemical
Quantumchemical cluster calculation of electronic charge density injec
tion in semiconductor interfacial processes has been extended to OH-,
K+ and H2O chemisorption on Ga- and As-sites of GaAs(110) and Ga-sites
of GaAs(111A) surfaces. Evaluation in terms of hydrogen reactions poi
nts to different charge transfer characteristics of reaction paths ove
r OH(ad) or H(ad) intermediates. The present approach simulates on ab
initio level the dynamical connexion of a local reactive process and d
elocalized charge density injection in a semiconductor space charge la
yer.