ELECTRONIC CHARGE-DENSITY INJECTION IN SEMICONDUCTOR INTERFACIAL PROCESSES - QUANTUM-CHEMICAL PROOF OF INJECTION DYNAMICS

Authors
Citation
C. Engler et W. Lorenz, ELECTRONIC CHARGE-DENSITY INJECTION IN SEMICONDUCTOR INTERFACIAL PROCESSES - QUANTUM-CHEMICAL PROOF OF INJECTION DYNAMICS, Zeitschrift für physikalische Chemie, 205, 1998, pp. 15-32
Citations number
35
Categorie Soggetti
Chemistry Physical","Physics, Atomic, Molecular & Chemical
ISSN journal
09429352
Volume
205
Year of publication
1998
Part
1
Pages
15 - 32
Database
ISI
SICI code
0942-9352(1998)205:<15:ECIISI>2.0.ZU;2-6
Abstract
Quantumchemical cluster calculation of electronic charge density injec tion in semiconductor interfacial processes has been extended to OH-, K+ and H2O chemisorption on Ga- and As-sites of GaAs(110) and Ga-sites of GaAs(111A) surfaces. Evaluation in terms of hydrogen reactions poi nts to different charge transfer characteristics of reaction paths ove r OH(ad) or H(ad) intermediates. The present approach simulates on ab initio level the dynamical connexion of a local reactive process and d elocalized charge density injection in a semiconductor space charge la yer.