LOW-TEMPERATURE-GROWN GAAS ENHANCED WET THERMAL-OXIDATION OF AL0.98GA0.02AS

Authors
Citation
H. Reese et al., LOW-TEMPERATURE-GROWN GAAS ENHANCED WET THERMAL-OXIDATION OF AL0.98GA0.02AS, Applied physics letters, 73(18), 1998, pp. 2624-2626
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
73
Issue
18
Year of publication
1998
Pages
2624 - 2626
Database
ISI
SICI code
0003-6951(1998)73:18<2624:LGEWTO>2.0.ZU;2-6
Abstract
The effects of incorporating low-temperature-grown GaAs (LT GaAs) into the layer structure of Al0.98Ga0.02As/GaAs are studied. Results show that the structures containing a 300 nm layer of LT GaAs have faster o xidation rates and lower oxidation temperatures compared to reference samples without the LT GaAs layer. This letter will discuss the mechan isms involved in the oxidation rate increase, attributed to the LT GaA s enhancing the transport of As species during the oxidation process. (C) 1998 American Institute of Physics. [S0003-6951(98)04544-6]