The effects of incorporating low-temperature-grown GaAs (LT GaAs) into
the layer structure of Al0.98Ga0.02As/GaAs are studied. Results show
that the structures containing a 300 nm layer of LT GaAs have faster o
xidation rates and lower oxidation temperatures compared to reference
samples without the LT GaAs layer. This letter will discuss the mechan
isms involved in the oxidation rate increase, attributed to the LT GaA
s enhancing the transport of As species during the oxidation process.
(C) 1998 American Institute of Physics. [S0003-6951(98)04544-6]