EBIC IMAGE-CONTRAST OF THE BULK DEFECTS I N SEMICONDUCTORS

Authors
LUKYANOV AE MELNIKOV GV ALSHAER V
Citation
Ae. Lukyanov et al., EBIC IMAGE-CONTRAST OF THE BULK DEFECTS I N SEMICONDUCTORS, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 57(8), 1993, pp. 20-24
Citations number
5
Categorie Soggetti
Physics
Journal title
Izvestia Akademii nauk SSSR. Seria fiziceskaa → ACNP
ISSN journal
03676765
Volume
57
Issue
8
Year of publication
1993
Pages
20 - 24
Database
ISI
SICI code
0367-6765(1993)57:8<20:EIOTBD>2.0.ZU;2-U