MEASUREMENT OF PLL PHASE ERROR CAUSED BY POWER-SUPPLY NOISE

Authors
JENKINS KA ECKHARDT JP
Citation
Ka. Jenkins et Jp. Eckhardt, MEASUREMENT OF PLL PHASE ERROR CAUSED BY POWER-SUPPLY NOISE, Electronics Letters, 34(20), 1998, pp. 1907-1908
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
34
Issue
20
Year of publication
1998
Pages
1907 - 1908
Database
ISI
SICI code
0013-5194(1998)34:20<1907:MOPPEC>2.0.ZU;2-0
Abstract
The measurement of the accumulated phase error of phase-locked loops ( PLLs) in microprocessor systems is discussed. A system which creates c ontrolled power supply noise and measures the PLL response is describe d. Examples of the use of this technique are shown for a PLL used in a 400 MHz microprocessor.