INHOMOGENEOUS PUMPING AND INCREASED FILAMENTATION THRESHOLD OF SEMICONDUCTOR-LASERS BY CONTACT PROFILING

Citation
Pmw. Skovgaard et al., INHOMOGENEOUS PUMPING AND INCREASED FILAMENTATION THRESHOLD OF SEMICONDUCTOR-LASERS BY CONTACT PROFILING, Electronics Letters, 34(20), 1998, pp. 1950-1951
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00135194
Volume
34
Issue
20
Year of publication
1998
Pages
1950 - 1951
Database
ISI
SICI code
0013-5194(1998)34:20<1950:IPAIFT>2.0.ZU;2-E
Abstract
The authors have fabricated inhomogeneously pumped broad area diode la sers using a novel digitated electrical contact pad to smooth the edge s of the transverse distribution of injected carriers. Experiments dem onstrate the effectiveness of this scheme in increasing the filamentat ion threshold and reducing near field modulation up to 35 times thresh old. The inhomogeneously pumped design has reduced threshold current a nd increased slope efficiency relative to a comparable standard broad area device.