A. Santarelli et al., BACKGATING MODEL INCLUDING SELF-HEATING FOR LOW-FREQUENCY DISPERSIVE EFFECTS IN III-V FETS, Electronics Letters, 34(20), 1998, pp. 1974-1976
A new approach is proposed which takes into account both traps and the
rmal phenomena for the modelling of deviations between static and dyna
mic drain current characteristics in III-V field effect transistor;. T
he model is based on the well-known 'backgating' concept and can easil
y be identified on the basis of conventional static drain current char
acteristics and small-signal, low-frequency S parameters. Experimental
results confirm the accuracy of the proposed model.