H. Yanagisawa et al., STUDY ON PREPARATION CONDITIONS OF HIGH-QUALITY ZRN THIN-FILMS USING A LOW-TEMPERATURE PROCESS, JPN J A P 1, 37(10), 1998, pp. 5714-5718
We have investigated the preparation conditions of stoichiometric ZrN
films with low resistivity and high crystallinity at relatively low te
mperatures using an ultrahigh vacuum sputtering system. The film quali
ty was evaluated by means of X-ray diffraction, X-ray photoelectron sp
ectroscopy and Auger electron spectroscopy analyses. The resistivities
were measured by a four-probe method. We found that stoichiometric Zr
N films with nearly single (100) orientation and resistivity of 17 mu
Omega cm grew on (100) Si under the optimum conditions of N-2 now rati
o of 3%, low Sputtering power of 15 W and substrate temperature of 500
degrees C. It is therefore concluded that high-quality ZrN films fan
be obtained at a relatively low substrate temperature, if appropriate
sputtering conditions are satisfied using an ultrahigh vacuum sputteri
ng system.