SURFACE KINETICS OF CFX RADICALS AND FLUORINE-ATOMS IN THE AFTERGLOW OF HIGH-DENSITY C4F8 PLASMAS

Citation
C. Suzuki et al., SURFACE KINETICS OF CFX RADICALS AND FLUORINE-ATOMS IN THE AFTERGLOW OF HIGH-DENSITY C4F8 PLASMAS, JPN J A P 1, 37(10), 1998, pp. 5763-5766
Citations number
14
Categorie Soggetti
Physics, Applied
Volume
37
Issue
10
Year of publication
1998
Pages
5763 - 5766
Database
ISI
SICI code
Abstract
Temporal variations of absolute densities of CF, CF2 and atomic fluori ne (F) were measured in the afterglow of high-density C4F8 plasmas gen erated by helicon-wave discharges. Laser-induced fluorescence (LIF) sp ectroscopy was adopted for CF and CF2 radicals, while vacuum ultraviol et (VUV) absorption spectroscopy was employed for the F atom. CF and F densities gradually decreased for 20-80 ms after the extinction of th e rf power, while CF2 density steadily increased during the same perio d, This slow increase in CF2 density can be explained by surface kinet ics of the radicals. In the afterglow of discharges with a high degree of dissociation, the increase in CF2 density is approximately equal t o CF density at the beginning of the afterglow, The mechanism for the surface production of CF2 in the afterglow is discussed based on the c lose relationships between the temporal variations of CF and CF2 densi ties.