INVESTIGATION OF STRONG ELECTRIC-FIELD-INDUCED SURFACE PHENOMENA BY SOFT X-UV LASER INTERFEROMETRY

Authors
ZEITOUN P ALBERT F JAEGLE P JOYEUX D CARILLON A HUBERT S JAMELOT G KLISNICK A PHALIPPOU D LAGRON JC ROS D SEBBAN S ZEITOUNFAKIRIS A
Citation
P. Zeitoun et al., INVESTIGATION OF STRONG ELECTRIC-FIELD-INDUCED SURFACE PHENOMENA BY SOFT X-UV LASER INTERFEROMETRY, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 416(1), 1998, pp. 189-191
Citations number
6
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
Journal title
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment → ACNP
ISSN journal
01689002
Volume
416
Issue
1
Year of publication
1998
Pages
189 - 191
Database
ISI
SICI code
0168-9002(1998)416:1<189:IOSESP>2.0.ZU;2-0
Abstract
Transient perturbed niobium surface states are observed for the first time during a long continued action of the applied DC-field owing to s urface imaging by the means of an X-UV laser interferometry technique. (C) 1998 Elsevier Science B.V. All rights reserved.