POSSIBILITY OF DETERMINING THE PARAMETERS OF SECONDARY LIGHT-SOURCES SMALLER THAN THE WAVELENGTH FROM THE FAR-FIELD CHARACTERISTICS

Citation
Vp. Veiko et al., POSSIBILITY OF DETERMINING THE PARAMETERS OF SECONDARY LIGHT-SOURCES SMALLER THAN THE WAVELENGTH FROM THE FAR-FIELD CHARACTERISTICS, Journal of optical technology, 65(10), 1998, pp. 792-795
Citations number
9
Categorie Soggetti
Optics
ISSN journal
10709762
Volume
65
Issue
10
Year of publication
1998
Pages
792 - 795
Database
ISI
SICI code
1070-9762(1998)65:10<792:PODTPO>2.0.ZU;2-5
Abstract
This paper proposes a new approach to the investigation of the paramet ers of secondary light sources smaller than the wavelength (subwavelen gth sources) from the known field distribution in the far field. Pictu res are given of the angular distribution of the amplitude and intensi ty of the diffracted light, calculated for undamped waves on the basis of a vector approach. Results unambiguously connected to the correspo nding subwavelength size of the apertures are given for reconstructing various initial field distributions at a screen. (C) 1998 The Optical Society of America. [S1070-9762(98)01110-5].