ELECTRICAL CHARACTERIZATION OF SEMICONDUCTING POLYMERS

Citation
P. Stallinga et al., ELECTRICAL CHARACTERIZATION OF SEMICONDUCTING POLYMERS, Acta Physica Polonica. A, 94(3), 1998, pp. 545-548
Citations number
3
Categorie Soggetti
Physics
Journal title
ISSN journal
05874246
Volume
94
Issue
3
Year of publication
1998
Pages
545 - 548
Database
ISI
SICI code
0587-4246(1998)94:3<545:ECOSP>2.0.ZU;2-N
Abstract
Schottky diodes resulting from an intimate contact of aluminum on elec trodeposited poly(3-methylthiopene) were studied by admittance spectro scopy, capacitance-voltage measurements and voltaic and optically-indu ced current and capacitance transients. The loss tangents show the exi stence of interface states that can be removed by vacuum annealing. Fu rthermore, the C-V curves contradict the idea of movement of the dopan t ions.