STRUCTURE, SURFACE-MORPHOLOGY AND OPTICAL-PROPERTIES OF THIN-FILMS OFZNS AND CDS GROWN BY ATOMIC LAYER EPITAXY

Citation
A. Szczerbakow et al., STRUCTURE, SURFACE-MORPHOLOGY AND OPTICAL-PROPERTIES OF THIN-FILMS OFZNS AND CDS GROWN BY ATOMIC LAYER EPITAXY, Acta Physica Polonica. A, 94(3), 1998, pp. 579-582
Citations number
4
Categorie Soggetti
Physics
Journal title
ISSN journal
05874246
Volume
94
Issue
3
Year of publication
1998
Pages
579 - 582
Database
ISI
SICI code
0587-4246(1998)94:3<579:SSAOOT>2.0.ZU;2-Z
Abstract
In this communication we report successful growth of monocrystalline c ubic ZnS and monocrystalline and polycrystalline cubic and wurtzite fi lms of CdS by atomic layer epitaxy. Structural and optical properties of these films are analysed. ZnS (and CdS/ZnS) films grown on GaAs sub strate are cubic. Atomic layer epitaxy grown films provide several adv antages over ZnS and CdS materials grown by other techniques, especial ly compared to bulk material, which is grown at higher temperatures. F irst results for ZnS/CdS/ZnS quantum well structures are also discusse d.