T. Satoh et al., FABRICATION PROCESSES FOR HIGH-T-C SUPERCONDUCTING INTEGRATED-CIRCUITS BASED ON EDGE-TYPE JOSEPHSON-JUNCTIONS, IEICE transactions on electronics, E81C(10), 1998, pp. 1532-1537
We have studied an in situ edge preparation process and the effect of
a substrate rotation during the edge preparation in order to improve t
he uniformity and electrical characteristics of high-T-c edge-type Jos
ephson junctions. The improved YBa2Cu3Ox/PrBa2Cu3Ox/YBa2Cu3Ox edge jun
ctions showed small la-critical current spreads as low as 10% for 12 j
unctions. We have confirmed that the spreads do not increase significa
ntly by adding groundplane over the junctions. In this paper, we will
describe these processes developed for the fabrication of high-T-c sup
erconducting integrated circuits.