Jw. Steeds et al., ON THE NATURE OF EXTENDED DEFECTS IN CVD DIAMOND AND THE ORIGIN OF COMPRESSIVE STRESSES, DIAMOND AND RELATED MATERIALS, 7(10), 1998, pp. 1437-1450
Diffraction contrast transmission electron microscopy has been used in
a detailed investigation of the nature of defects in thick square-fac
eted CVD diamond films. It is concluded that each crystallite progress
es from octahedral growth with {111} facets to truncated octahedra bef
ore reaching the final form with large square facets. Open-faced tetra
hedral defects are formed on the {111} faces of the octahedra with fau
lts or very thin twins on the three {111} planes inclined to each face
t growth surface. By micro-Raman experiments on individual grains of e
lectron transparent regions and electron-energy-loss spectroscopy, it
was shown that the defective regions are associated with the incorpora
tion of non-diamond carbon and a model is proposed, based on this info
rmation, to account for the very high compressive stresses that have b
een found in these diamond films. Published by Elsevier Science S.A. A
ll rights reserved.