SCALABLE PD SOI CMOS WITH FLOATING BODIES

Citation
Jg. Fossum et al., SCALABLE PD SOI CMOS WITH FLOATING BODIES, IEEE electron device letters, 19(11), 1998, pp. 414-416
Citations number
14
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
07413106
Volume
19
Issue
11
Year of publication
1998
Pages
414 - 416
Database
ISI
SICI code
0741-3106(1998)19:11<414:SPSCWF>2.0.ZU;2-K
Abstract
An insightful analysis of the Boating-body (FB) effect on off-state cu rrent (I-off) in PD/SOI MOSFET's is done based on simulations calibrat ed to a published scaled SOI CMOS technology [1], In contrast to the c onclusion drawn in [1], the simulations reveal that proven, easily int egrated processes for enhancing carrier recombination in the source/dr ain junction region, in conjunction with normal elevated chip temperat ure of operation, can effectively suppress the FB-induced increase of I-off, thus enabling exploitation of the unique benefits of scaled PD/ SOI CMOS circuits.