An insightful analysis of the Boating-body (FB) effect on off-state cu
rrent (I-off) in PD/SOI MOSFET's is done based on simulations calibrat
ed to a published scaled SOI CMOS technology [1], In contrast to the c
onclusion drawn in [1], the simulations reveal that proven, easily int
egrated processes for enhancing carrier recombination in the source/dr
ain junction region, in conjunction with normal elevated chip temperat
ure of operation, can effectively suppress the FB-induced increase of
I-off, thus enabling exploitation of the unique benefits of scaled PD/
SOI CMOS circuits.