I. Zergioti et M. Stuke, SHORT-PULSE UV LASER-ABLATION OF SOLID AND LIQUID GALLIUM, Applied physics A: Materials science & processing, 67(4), 1998, pp. 391-395
UV laser ablation of gallium from the solid (300 K) and liquid (330K)
phase is reported. The ablation is performed by using a 248 nm excimer
laser with pulse durations of 15 ns and 0.5 ps. The ablated neutrals
are ionised by resonant multiphoton ionization with a time-delayed las
er (605 nm, 15 ns) and are detected by time-of-flight mass spectroscop
y. The ablation threshold fluences, the ablation rates, and the veloci
ty distributions of Ga atoms from the solid and liquid phase for irrad
iation with 0.5 ps and 15 ns pulses are determined. The threshold flue
nce for 0.5 ps laser ablation is found to be 7 times lower than that f
or 15 ns laser ablation and is identical for the solid and liquid samp
les of gallium. For ns pulses, the threshold fluence is 1.5 times high
er for the solid compared to the liquid phase. This difference between
the sub-picosecond and nanosecond laser ablation behaviour can be exp
lained by the longer and deeper heat diffusion during the longer laser
pulses. The time-of-flight measurements show the thermal behaviour of
the removed Ga atoms in both 0.5 ps and 15 ns laser ablation and are
fitted to Maxwell-Boltzmann distributions giving translational tempera
tures of several thousand Kelvin. An increase in the temperature as a
function of the ablation laser fluence is observed.