K. Efimenko et al., ELECTRICAL-PROPERTIES OF AU-POLYSTYRENE-AU SUBMICRON STRUCTURES, Applied physics A: Materials science & processing, 67(5), 1998, pp. 503-505
Electrical forming and voltage-current characteristics of Au-polystyre
ne-Au (MIM) structures created on a glassy substrate were studied. Pol
ystyrene (PS) isolating films, 180-800nm thick, were prepared by spinn
ing from a solution. It was shown that the electroforming of MIM struc
tures occurs at the voltage of 6-6.5 V and that the shaping rate depen
ds on the insulator thickness, temperature, and the shaping time. The
voltage-current characteristics exhibit a region with ohmic behaviour
and, above a certain voltage, a region with effective negative resista
nce. The negative resistance is explained by deterioration of conducti
ve Au filaments at higher voltages. The voltage decrease does not resu
lt in a complete recovery of all filaments.